What is a Probe Card?
A probe card is a specialized testing device used during wafer testing (also known as wafer sort). It contains numerous tiny probes that make electrical contact with the pads or bumps on a semiconductor wafer. These probes transmit signals between the wafer and automated test equipment, enabling manufacturers to verify the performance and functionality of each die before it is cut and packaged.
Probe cards are designed with high precision to accommodate various chip architectures and technologies. They must maintain accurate alignment and consistent contact to avoid damaging the wafer or producing incorrect test results.
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